Journal Title：X-ray Spectrometry

X-Ray Spectrometry is devoted to the rapid publication of papers dealing with the theory and application of x-ray spectrometry using electron, x-ray photon, proton, γ and γ-x sources.

Covering advances in techniques, methods and equipment, this established journal provides the ideal platform for the discussion of more sophisticated X-ray analytical methods.

Both wavelength and energy dispersion systems are covered together with a range of data handling methods, from the most simple to very sophisticated software programs. Papers dealing with the application of x-ray spectrometric methods for structural analysis are also featured as well as applications papers covering a wide range of areas such as environmental analysis and monitoring, art and archaelogical studies, mineralogy, forensics, geology, surface science and materials analysis, biomedical and pharmaceutical applications.

《X 射線光譜法》致力于快速發(fā)表有關(guān)使用電子、X 射線光子、質(zhì)子、γ 和 γ-x 源的 X 射線光譜法理論和應(yīng)用的論文。

這本知名期刊涵蓋了技術(shù)、方法和設(shè)備的進(jìn)步，為討論更復(fù)雜的 X 射線分析方法提供了理想的平臺。

涵蓋了波長和能量色散系統(tǒng)以及一系列數(shù)據(jù)處理方法，從最簡單到非常復(fù)雜的軟件程序。還介紹了有關(guān) X 射線光譜法在結(jié)構(gòu)分析中的應(yīng)用的論文以及涵蓋環(huán)境分析和監(jiān)測、藝術(shù)和考古研究、礦物學(xué)、法醫(yī)學(xué)、地質(zhì)學(xué)、表面科學(xué)和材料分析、生物醫(yī)學(xué)和制藥應(yīng)用等廣泛領(lǐng)域的應(yīng)用論文。

X-ray Spectrometry創(chuàng)刊于1972年，由John Wiley and Sons Ltd出版商出版，收稿方向涵蓋物理 - 光譜學(xué)全領(lǐng)域，此期刊水平偏中等偏靠后，在所屬細(xì)分領(lǐng)域中專業(yè)影響力一般，過審相對較易，如果您文章質(zhì)量佳，選擇此期刊，發(fā)表機(jī)率較高。平均審稿速度 較慢,6-12周 ，影響因子指數(shù)1.5，該期刊近期沒有被列入國際期刊預(yù)警名單，廣大學(xué)者值得一試。